Participation in the IEEE EWDTS-2024 Symposium
Professors of the Design Automation Department Hahanov V.I., Chumachenko S.V., and Lytvynova Ye.I. participated in the 20th IEEE East-West Design & Test Symposium (EWDTS), held on November 13-17, 2024, in Yerevan, Armenia, with the reports “Vector-Logical In-Memory Simulation of Faults as Truth Table Addresses” and “Prompt-Testing of Logic.” The symposium materials are published in IEEExplore and indexed by Scopus in February 2025.
The IEEE East-West Design & Test Symposium 2024 explored new trends in testing, diagnostics, and repair of microelectronic systems, as well as cybersecurity, automotive engineering, the Internet of Things, and artificial intelligence. It brought together leading scientists from 27 countries around the world. There were 17 keynote speakers invited, a record for the 20-year history of the EWDTS symposium. The symposium’s theme was represented by many CAD and EDA areas, which are increasingly permeated by AI tools. Each day of the symposium was marked by a round table of scientific discussions, where experts in AI computing discussed issues of technological excellence in product quality management, product processes, and services. This was reflected in a meeting of scientists, business people, and researchers dedicated to the intellectualization of education and industry in Armenia, when more than 1000 people gathered simultaneously in a huge hall, eager to implement AI mechanisms in all spheres of human activity to achieve the Sustainable Development Goals (SDG 11 – sustainable cities and communities, SDG 17 – partnership for sustainable development, and others). The invited keynotes presented reports reflecting current trends in AI computing (quality of microelectronic 3D products, AI-computing in design and test; prompt AI-engineering). Regular reports (70 papers) at the symposium were presented by well-known scientific schools.
