25th Anniversary IEEE European Test Symposium

The 25th IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation.

In 2020, ETS in Tallinn, Estonia had to be replaced by a virtual event as a result of the worldwide COVID-19 outbreak. The symposium is organized by the Tallinn University of Technology (TalTech), which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA).

In the challenging circumstances, the primary goal of the Executive Committee is to deliver a great event with the atmosphere of a true ETS respected by the test community. The anniversary 25th edition will feature, as always, distinguished keynotes, excellent long and short scientific papers, special sessions on emerging, yet complementary topics, trendy embedded tutorials, informal contributions on hot topics and industrial case studies, “new blood” contributions to PhD forum along with the McCluskey doctoral thesis contest.

25th Anniversary IEEE European Test Symposium is:
– Nearly 24h of video content
– Over 60 videos altogether
– 2 Keynotes
– 3 Embedded Tutorials
– 4 Special Sessions
– 10 Regular Sessions (long and short talks)
– Submissions from 32 countries
– Live opening and closing ceremony
– Live keynote with live Q&A
– Conference duration: 1 week (access to materials: 2 weeks)
– Registration fee: 50 EUR https://ets2020.ttu.ee/index.php?page=86
You are welcome!